Item(unit) |
Specification |
Inspection method |
Conductivity Type |
P |
PN testing machine |
Dopant |
Gallium |
/ |
Crystallinity |
Mono Crystalline |
Preferential Etch Techniques (ASTM F47-88) |
Dislocation Density |
≤500cm-2 |
|
Surface Orientation |
<100>±3° |
X-ray Diffraction Method |
Side Orientation |
<010>, <001>±3° |
|
Oxygen Concentration(ppma) |
≤16 |
FTIR (ASTM F121-83) |
Carbon Concentration (ppma) |
≤1 |
FTIR(ASTM F123-91) |
Shape /Size(mm) |
182±0.25mm |
Automatic sorting machine |
Thickness(μm) |
155﹢10/﹣10 |
|
150﹢10/﹣10 |
Item(unit) |
Specification |
Inspection method |
Lifetime(μs) |
≥70 |
BCT-400 |
Resistivity(Ω.cm) |
0.4-1.1 |
Automatic sorting machine |