|
Item(unit) |
Specification |
Inspection method |
|
Conductivity Type |
P |
PN testing machine |
|
Dopant |
Gallium |
/ |
|
Crystallinity |
Mono Crystalline |
Preferential Etch Techniques （ASTM F47-88） |
|
Dislocation Density |
≤500cm-2 |
|
|
Surface Orientation |
<100>±3° |
X-ray Diffraction Method |
|
Side Orientation |
<010>, <001>±3° |
|
|
Oxygen Concentration（ppma） |
≤16 |
FTIR (ASTM F121-83) |
|
Carbon Concentration （ppma） |
≤1 |
FTIR（ASTM F123-91） |
|
Shape /Size（mm） |
182±0.25mm |
Automatic sorting machine |
|
Thickness（μm） |
155﹢10/﹣10 |
|
|
150﹢10/﹣10 |
|
Item(unit) |
Specification |
Inspection method |
|
Lifetime（μs） |
≥70 |
BCT-400 |
|
Resistivity(Ω．cm) |
0.4-1.1 |
Automatic sorting machine |
