• N-Type 210
  • N-Type 210

N-Type 210

  • Low Oxygen Large Heat Field Process
  • High-efficiency wafers that match customers' differentiated needs
  • Adequate capacity reserves
  • N-Type 210
Desciption
Material properties

Item(unit)

Specification

Inspection method

Conductivity Type

N

PN testing machine

Dopant

Phosphorus

/

Crystallinity

Mono Crystalline

Preferential Etch Techniques

(ASTM F47-88)

Dislocation Density

≤500cm-2

Surface Orientation

<100>±3°

X-ray Diffraction Method

Side Orientation

<010>, <001>±3°

Oxygen Concentration(ppma)

≤12

FTIR (ASTM F121-83)

Carbon Concentration  (ppma)

≤1

FTIR(ASTM F123-91)

 

Shape /Size(mm)

210±0.25mm

Automatic sorting machine

Thickness(μm)

130﹢10/﹣10

135﹢10/﹣10

 
 Electrical properties

Item(unit)

Specification

Inspection method

Lifetime(μs)

≥800

BCT-400

Resistivity(Ω.cm)

0.3-2.1

Automatic sorting machine

 


 
 
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